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 | Testing of Digital Systems (1st Edition) by Niraj K. Jha, Sandeep Gupta Md, N. K. (Princeton University, New Jersey), S. (University Of Southern California) Gupta Hardcover, 1,016 Pages, Published 2003 ISBN-10: 0-521-77356-3 / 0521773563 ISBN-13: 978-0-521-77356-0 / 9780521773560 Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting ri | |