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University Of Massachusetts-Amherst - Fall 2012 | ||
Section 01 | ||
 | Scanning Electron Microscopy and X-ray Microanalysis: Third Edition (3rd Edition) by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael, Joseph Michael, L.C. Sawyer Hardcover, 690 Pages, Published 2007 ISBN-10: 0-306-47292-9 / 0306472929 ISBN-13: 978-0-306-47292-3 / 9780306472923 In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis there has been a great expansion in the capabilities of the basic scanning electron microscope SEM and the x-ray spectrometers The emergence of the variab- pressureenvironmental SEM has | |