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New Jersey Institute Of Technology - 1/2 Fall 2012 | ||
Section 001 | ||
 | Built In Test for VLSI: Pseudorandom Techniques (1st Edition) by Paul H. Bardell, Jacob Savir, William H. Mcanney Hardcover, 368 Pages, Published 1987 ISBN-10: 0-471-62463-2 / 0471624632 ISBN-13: 978-0-471-62463-9 / 9780471624639 This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treat | |