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Montclair State University - FALL 2012 | ||
Section 01 | ||
 | Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (2nd Edition) by S. Reed Paperback, 212 Pages, Published 2010 ISBN-10: 0-521-14230-X / 052114230X ISBN-13: 978-0-521-14230-4 / 9780521142304 Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X | |